WebThe Sentris thermal imaging microscope pinpoints the low-level infrared thermal emissions by IC faults such as short circuits and leakage current. Using a non-destructive testing (NDT) process called lock-in thermography, failures can be isolated on both bare (front or backside) and packaged devices and no surface coating is required. http://www.leaderwe.com/en/products/optotherm-product/
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WebJun 4, 2014 · Optotherm, Inc. 2591 Wexford-Bayne Rd Suite 304 Sewickley, PA 15143 USA phone +1 (724) 940-7600 fax +1 (724) 940-7611 www.optotherm.com Optotherm Sentris/Micro Application Note Thermal Resistance Measurement 1 Importance of Thermal Characterization As electronic semiconductor devices continue to decrease in size, heat … WebJan 5, 2024 · Infrared photo of the microheater showing emitted radiation distribution on the suspended membrane with a supplied voltage of 1.57 V (i.e., estimated temperature of ∼150 °C from the TCR). citizenship attire
Optotherm Sentris, Electronics Failure Analysis System
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